Archive for the ‘2009’ Category

  • 25.08.09

    [C126] Dominic Carrier and Jan J. Dubowski, “‘Rapid Prototyping’ of Biosensing Surface Plasmon Resonance Devices Using COMSOL & Matlab Software”, 5th Annual COMSOL Conference, Boston, […]

  • 25.08.09

    [C125] Jan J. Dubowski, “Bio-functionalized Surface of GaAs (001) for Detection of Viral Pathogens”, invited talk, 6th International Workshop on Semiconductor Surface Passivation, Zakopane, Poland,September […]

  • 25.08.09

    [C124] Dominic Lepage and Jan J. Dubowski, “Surface plasmon effects induced by uncollimated emission of semiconductor microstructures”, poster presentation, Trends in Nanotechnology, Barcelona, Spain, September […]

  • 25.08.09

    [C123] Jan J. Dubowski, “Laser-induced bandgap engineering of quantum semiconductor wafers”, invited talk, 8th Pacific Conference on Lasers and Electro-Optics, Shanghai, China, Aug. 30 – […]

  • 25.08.09

    [C122] Romain Béal, Radoslaw Stanowski, Neng Liu, Vincent Aimez, Jan J. Dubowski, “Superluminescent diodes based on UV and IR laser induced quantum well intermixing”, 14th […]

  • 08.06.09

    [C111] J.J. Dubowski, “Microstructuring of Photosensitive Glass with an ArF Excimer Laser Projection Patterning Technique”, CIPI AGM and 10th Anniversary, Québec City, May 25-27, 2009.

  • 08.06.09

    [C112] J. Dion, A. Li, P. Masson, J.J. Dubowski, “Rapid microstructuring of photosensitive glass with an ArF excimer laser projection patterning technique”, 10th International Symposium […]

  • 08.06.09

    [C113] J.J. Dubowski, “Quantum dot template biosensor”, invited seminar at the Institute of Solid State Physics, Tokyo University, Tokyo, Japan, July 3, 2009.

  • 08.06.09

    [C114] J.J. Dubowski, “Quantum Semiconductor Biosensor Technology: A missing link to total solutions by micro-Total Analysis Systems”, Canada-Japan Workshop, Forging Int. Res. Links with CLAN: […]

  • 08.06.09

    [C115] J.J. Dubowski, “Quantum Semiconductor Biosensor Technology: A missing link to total solutions by micro-Total Analysis Systems”, invited seminar, RIKEN, Wako-shi, Japan,July 6, 2009.