Tri-National Workshop on Standards for Nanotechnology, Ottawa, Canada

[C78] G.M. Marshall, F. Bensebaa, X. Ding and J.J. Dubowski, “Angle Resolved X-ray Photoelectron Spectroscopy for Nanoscale Metrology of Self-Assembled Monolayer/Semiconductor Interfaces”, the Tri-National Workshop on Standards for Nanotechnology, National Research Council Canada, Ottawa, February 7, 2007.

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