[B3]

In: Handbook of Thin Film Materials: “In-Situ Faraday-Modulated Fast-Nulling Single-Wavelength Ellipsometry of the Growth of Semiconductors, Dielectric and Metal Films”, J.D. Leslie, H.X. Tran, S. Buchanan, J.J. Dubowski, S.R. Das, L. LeBrun, Editor: H.S. Nalwa, Academic Press, 2002, pp. 331-372.